وحده الاشعة السينية

X-ray diffraction (XRD) is the ideal, non-destructive analytical method for examining samples

XRD enables crystalline phases to be identified, quantified, and their atomic structure determined all with very little sample preparation. This prevents the risk of destroying the phases and/or modifying the characteristics of the sample. In reality, a sample with a complex composition is a daunting challenge for many other methods – but not so for XRD. With XRD, every detail in the diffractogram is meaningful and ultimately enables the full characterization of a sample. A diffractogram consists of peak positions, Intensities and shapes, which are characteristic of a specific sample. Using this data, one can deduce the properties of the sample and obtain information that includes

Phase abundance

Phase amounts

Textures

Residual stress

Crystal structure

Microstructure